![]({"xsmall":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.100.33.0,787,3776,2046.file/on_demand.jpg","small":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.360.120.0,787,3776,2046.file/on_demand.jpg","medium":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.768.256.0,787,3776,2046.file/on_demand.jpg","large":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.1024.341.0,787,3776,2046.file/on_demand.jpg","xlarge":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.1280.427.0,787,3776,2046.file/on_demand.jpg","xxlarge":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.1440.480.0,787,3776,2046.file/on_demand.jpg","max":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/on_demand.jpg/_jcr_content/renditions/original.image_file.1920.640.0,787,3776,2046.file/on_demand.jpg"})
Recursos Adicionais
Ferramentas para apoiar sua jornada em metrologia
![]({"xsmall":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/on-demand-detail.jpg/_jcr_content/renditions/original.image_file.100.56.0,46,1000,609.file/on-demand-detail.jpg","small":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/on-demand-detail.jpg/_jcr_content/renditions/original.image_file.360.203.0,46,1000,609.file/on-demand-detail.jpg","medium":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/on-demand-detail.jpg/_jcr_content/renditions/original.image_file.768.432.0,46,1000,609.file/on-demand-detail.jpg","large":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/on-demand-detail.jpg/_jcr_content/renditions/original.image_file.1000.563.0,46,1000,609.file/on-demand-detail.jpg","xlarge":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/on-demand-detail.jpg/_jcr_content/renditions/original.image_file.1000.563.0,46,1000,609.file/on-demand-detail.jpg","xxlarge":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/on-demand-detail.jpg/_jcr_content/renditions/original.image_file.1000.563.0,46,1000,609.file/on-demand-detail.jpg","max":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/on-demand-detail.jpg/_jcr_content/renditions/original.image_file.1000.563.0,46,1000,609.file/on-demand-detail.jpg"})
Precisa de respostas rápidas para suas perguntas? Use nossos aplicativos e e-books para procurar informações sobre metrologia a qualquer momento. Com recursos como o Cookbook App, pôsteres de metrologia para download e e-books, você tem acesso a materiais de aprendizado práticos na palma da sua mão.
Aplicativos de Soluções para Qualidade
Tenha acesso a conhecimentos básicos sob demanda. Faça o download de aplicativos dedicados à rugosidade, tomografia computadorizada, GD&T e metrologia de engrenagens. Acesse as estratégias de medição mais comuns em nosso aplicativo Cookbook. Baixe todos os aplicativos na App Store ou Google Play Store.
e-books da ZEISS
Quando você precisar de respostas em tempo real, nossos e-books estarão à sua disposição. Acesse-os rapidamente no seu smartphone ou tablet para obter as informações que precisa, a qualquer momento. Prefere uma versão impressa? Você encontra na nossa ZEISS Metrology Shop.
![]({"xsmall":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/measurement_strategies.png/_jcr_content/renditions/original.image_file.100.100.file/measurement_strategies.png","small":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/measurement_strategies.png/_jcr_content/renditions/original.image_file.360.360.file/measurement_strategies.png","medium":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/measurement_strategies.png/_jcr_content/renditions/original.image_file.768.768.file/measurement_strategies.png","large":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/measurement_strategies.png/_jcr_content/renditions/original.image_file.1024.1024.file/measurement_strategies.png","xlarge":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/measurement_strategies.png/_jcr_content/renditions/original.image_file.1280.1280.file/measurement_strategies.png","xxlarge":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/measurement_strategies.png/_jcr_content/renditions/original.image_file.1440.1440.file/measurement_strategies.png","max":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/measurement_strategies.png/_jcr_content/renditions/original./measurement_strategies.png"})
Estratégias de medição
Metrologia de coordenadas de contatoSaiba como definir e documentar estratégias de medição. Os tópicos incluem fixação, definição de referências, sondagem, avaliação e apresentação dos resultados.
![]({"xsmall":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/gps.png/_jcr_content/renditions/original.image_file.100.100.file/gps.png","small":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/gps.png/_jcr_content/renditions/original.image_file.360.360.file/gps.png","medium":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/gps.png/_jcr_content/renditions/original.image_file.768.768.file/gps.png","large":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/gps.png/_jcr_content/renditions/original.image_file.1024.1024.file/gps.png","xlarge":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/gps.png/_jcr_content/renditions/original.image_file.1280.1280.file/gps.png","xxlarge":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/gps.png/_jcr_content/renditions/original.image_file.1440.1440.file/gps.png","max":"https://www.zeiss.com.br/content/dam/iqs/r/services/zeiss-academy-metrology/zeiss-academy-metrology-oc/additional-resources/gps.png/_jcr_content/renditions/original./gps.png"})
Definição de tolerâncias em conformidade com normas, de acordo com a forma e o local
Possibilidades de novas normas GPSExplore os diferentes aspectos do dimensionamento e da tolerância de peças para garantir a funcionalidade, estabilidade da produção e conformidade com as normas. Obtenha uma visão geral das normas internacionais de GPS, incluindo as diferenças de padronização da ASME. São derivadas e explicadas 14 regras sobre tolerância em conformidade com o teste.
![Pré-visualizar imagem de GPS Poster 2023, EN]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/iqs2/d9c9282d-2417-45fb-8c2c-0b5d1665a8ae/Poster_GPS_EN.pdf.jpg"} "Baixar GPS Poster 2023, EN")
![Pré-visualizar imagem de Learning path CALIGO]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/iqs2/9898d619-aeba-4187-8b28-08247fb0d57c/LP_CALIGO.pdf.jpg"} "Baixar Learning path CALIGO")
![Pré-visualizar imagem de Learning path CALYPSO]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/iqs2/e34b1df0-7f5c-4472-a907-ffdf9b114289/LP_CALYPSO_V2.pdf.jpg"} "Baixar Learning path CALYPSO")
![Pré-visualizar imagem de Learning path Optical 3D]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/iqs2/7dbda708-aad4-4540-a22e-9ff4d187ccad/LP_Optical3D_V2.pdf.jpg"} "Baixar Learning path Optical 3D")
![Pré-visualizar imagem de Learning path X-ray]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/iqs2/089119b7-dda2-441d-8911-88f257f42748/LP_XRAY.pdf.jpg"} "Baixar Learning path X-ray")
![Pré-visualizar imagem de Poster ASME 2026]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/iqs2/1962eff7-af18-4029-ab0b-89508663c6cb/Poster_ASME_EN.pdf.jpg"} "Baixar Poster ASME 2026")
![Pré-visualizar imagem de ZEISS ACADEMY METROLOGY Training Guide Digital EN]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/iqs2/3726feff-cb78-4f37-9894-33384ea17f78/ZEISS_Training_Brochure_EN_lowres_465191_0.pdf.jpg"} "Baixar ZEISS ACADEMY METROLOGY Training Guide Digital EN")